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학술지 Characteristics of waveguide photodetectors at high-power optical input
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저자
최중선, 권용환, 김기수
발행일
200504
출처
IEEE Photonics Technology Letters, v.17 no.4, pp.881-883
ISSN
1041-1135
출판사
IEEE
DOI
https://dx.doi.org/10.1109/LPT.2005.844003
협약과제
04MB2700, 40G 모듈(테라비트 통신용 InP RF 집적회로 기술개발), 이명현
초록
High-power characteristics of waveguide photodetectors (PDs) with various absorbing layer thicknesses were analyzed. When large photocurrent was generated by high-power optical input, the saturation of radio frequency response was closely related with the optical absorption efficiency. The device with a single quantum well absorbing layer showed no saturation behavior until the device failure, while PDs with a thicker absorbing layer were saturated at photocurrent of a few milliamperes. It was also found that as optical confinement decreases, the maximum photocurrent the device can endure increases by more than three times. © 2005 IEEE.
KSP 제안 키워드
Absorbing layer, Device failure, Frequency response(FreRes), High-power characteristics, Optical absorption efficiency, Quantum Well(QW), Radio Frequency(RF), optical confinement, single quantum well