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학술대회 The Detection of Curve-type Defects in the TFT-LCD Panels with Machine Vision
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저자
김우섭, 오종환, 정윤수, 최일, 박길흠
발행일
200511
출처
TENCON 2005, pp.1-5
DOI
https://dx.doi.org/10.1109/TENCON.2005.301019
협약과제
05MK2300, 고인식 다중생체인식 전용칩셋 기술, 정교일
초록
The needs of automated inspection system are grown for the Flat Panel Displays (FPD). However, it is so difficult to detect the defects on the surface of FPD due to non-uniform intensity distribution through the whole panel. Especially, curve-type defects such as micro sized thread and scratch are too difficult to detect with the conventional methods. In this paper, we propose a robust detection algorithm for curve-type defects. The proposed algorithm is composed of flattening, segmentation, and classification. The flattening makes intensity distribution likely to be uniform. The segmentation extracts candidates of curve-type defect and the classification selects real defects from candidates. The experimental result verifies the performance of the proposed method.
KSP 제안 키워드
Automated inspection system, Conventional methods, Curve-type, Detection algorithm, Experimental Result, Non-uniform, TFT-LCD, Uniform intensity distribution, flat panel display(FPD), machine vision, robust detection