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Conference Paper Test System for Device Drivers of Embedded Systems
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Authors
Yu Seung Ma, Chae Deok Lim
Issue Date
2006-02
Citation
International Conference on Advanced Communication Technology (ICACT) 2006, pp.550-552
Language
English
Type
Conference Paper
Project Code
06MW1600, Development of Automatic Code Generation Technology for Device Drivers, Woo Duk Kyun
Abstract
Device drivers are difficult to write and error-prone and thus constituent the main portion of system failure. Therefore, to ensure that device drivers can run properly, their qualities have to be assured. In this paper, we will suggest architecture of a test system for device drivers. This architecture is designed to reflect embedded systems whose resources are usually limited. We also propose a reusable test case generation method for device drivers. We hope our method reduces the high cost of testing device drivers.
KSP Keywords
Device driver, Embedded system, Test case generation, Test system, Testing device, system failure