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학술대회
Test System for Device Drivers of Embedded Systems
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- 발행일
- 200602
- 출처
- International Conference on Advanced Communication Technology (ICACT) 2006, pp.550-552
- 협약과제
- 06MW1600, 디바이스 드라이버 소스 코드 자동 생성 기술개발, 우덕균
- 초록
- Device drivers are difficult to write and error-prone and thus constituent the main portion of system failure. Therefore, to ensure that device drivers can run properly, their qualities have to be assured. In this paper, we will suggest architecture of a test system for device drivers. This architecture is designed to reflect embedded systems whose resources are usually limited. We also propose a reusable test case generation method for device drivers. We hope our method reduces the high cost of testing device drivers.
- KSP 제안 키워드
- Device driver, Embedded system, Test case generation, Test system, Testing device, system failure