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Conference Paper
Test System for Device Drivers of Embedded Systems
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- Authors
- Yu Seung Ma, Chae Deok Lim
- Issue Date
- 2006-02
- Citation
- International Conference on Advanced Communication Technology (ICACT) 2006, pp.550-552
- Publisher
- IEEE
- Language
- English
- Type
- Conference Paper
- Abstract
- Device drivers are difficult to write and error-prone and thus constituent the main portion of system failure. Therefore, to ensure that device drivers can run properly, their qualities have to be assured. In this paper, we will suggest architecture of a test system for device drivers. This architecture is designed to reflect embedded systems whose resources are usually limited. We also propose a reusable test case generation method for device drivers. We hope our method reduces the high cost of testing device drivers.
- KSP Keywords
- Device driver, Embedded system, Test case generation, Test system, Testing device, system failure