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Conference Paper Evaluation of Mutation Testing for Object-Oriented Programs

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Authors: Yu Seung Ma, Mary Jean Harrold, Yong Rae Kwon

Issue Date: 2006-05

Citation: International Conference on Semiconductor Electronics (ICSE) 2006, pp.869-872

Language: English

Type: Conference Paper

Project Code: 06MW1600, Development of Automatic Code Generation Technology for Device Drivers, Woo Duk Kyun

KSP Keywords: Mutation Testing, object-oriented programs

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