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학술대회 Two Dimensional 32x32 InGaAs/InP Photodiode Arrays and Dark Current Characteristics Limited by the Diffusion and Generation-Recombiniation
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저자
남은수, 오명숙, 홍선의, 김홍승
발행일
200607
출처
International Conference on Optical Internet and Next Generation Network (COIN-NGNCON) 2006, pp.78-80
DOI
https://dx.doi.org/10.1109/COINNGNCON.2006.4454569
협약과제
06DB1100, 3차원 거리/영상 신호처리 집적화 회로를 내장한 InGaAs 광검출 수신기, 김호영
초록
In the 2 dimensional InGaAs/InP photodiode arrays on semi-insulating InP the dark current limited by the diffusion and generation-recombination. The static dark current of the InGaAs/InP PiN photodiode arrays is proportional to the number of the pixels in the array. In PiN InGaAs photodiode array structure, the diffusion currents of the each pixel due to the thermally generated minority carriers diffusing into the depletion region are accumulated to reach total leakage current. This phenomenon of pixel number dependent leakage current is due to the accumulation of the contributed diffusion current as much as ~0.02 pA/cm-2 from the each pixel photodiode comprising the array. ©2006 OSIA.
KSP 제안 키워드
Current characteristics, Dark Current, InGaAs photodiode, Leakage current, Minority carrier, PIN photodiodes, Photodiode array, Semi-Insulating, array structure, depletion region, diffusion current