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Conference Paper
Implant Isolation Characteristics for SoC Application
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- Authors
- Sung Il Kim, Chul Wook Lee, Yong Soon Baek, Jong Tae Moon
- Issue Date
- 2006-09
- Citation
- European Microwave Integrated Circuits Conference (EuMIC) 2006, pp.403-405
- Language
- English
- Type
- Conference Paper
- Abstract
- The isolation issue has manifested itself for system-on-chip (SoC) applications in future because it possesses a key technology for mixed-mode circuits. We have measured and analyzed implant isolation characteristics for high degree of isolation. We derived an equivalent circuit from the measurement and analysis of various implant conditions, which can be used for SoC design and fabrication fields. © 2006 EuMA.
- KSP Keywords
- Degree of isolation, Design and fabrication, Equivalent Circuit, High degree, Key technology, Measurement and analysis, SoC Design, SoC application, System-On-Chip(SoC), mixed-mode