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Characterization of Tris(8-Hydroxyquinoline) Aluminum (Alq3) Film using Spectroscopic Ellipsometry
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- Authors
- Yong Jai Cho, Hyun Jong Kim, Gal Won Che, Hyun Mo Cho, Un Bong Baek, Seung Hoon Nahm, Jeong Ik Lee, Hye Yong Chu
- Issue Date
- 2006-10
- Citation
- International Journal of Modern Physics B, v.20, no.25-27, pp.4353-4358
- ISSN
- 0217-9792
- Publisher
- World Scientific
- Language
- English
- Type
- Journal Article
- Abstract
- We have applied spectroscopic ellipsometry to obtain the optical constants, i.e., refractive indices (n) and extinction coefficients (k) of a thin tris (8-hydroxyquinoline) aluminum (Alq3) film evaporated on the top of 300-nm-thick SiO2 layer on a silicon substrate. Using a spectroscopic ellipsometer we collected the ellipsometric data of 顆 and ?? at 3 incident angles of 65째, 70째 and 75째 and 226 energies of 1.5 eV to 6.0 eV. For the organic sample, we adopted a simple two-film model consisting of ambient/organic film/SiO2 film/silicon substrate. Using the multiple oscillators of Tauc-Lorentz (TL) dispersion function and the two-film model, we obtained the thickness of the Alq3 film. By data inversion technique, the spectra of n and k for the Alq3 film are calculated from measured 顆 and ?? at each photon energy when the film thickness is fixed to a value obtained by the TL dispersion fitting. The extrapolation of optical function near band gap yields the band gap of 2.64 eV for Alq 3 film. © World Scientific Publishing Company.
- KSP Keywords
- 8-hydroxyquinoline(8-HQ), Alq 3, Data inversion, Extinction coefficient, Film thickness, Optical functions, Organic films, Scientific publishing, Silicon substrate, Spectroscopic ellipsometry, Tauc-Lorentz