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Conference Paper
A CMOS Burst-Mode TIA with Step AGC and Selective Internally Created Reset for 1.25Gb/s EPON
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- Authors
- Quan Le, Sang-Gug Lee, Ho-Yong Kang, Sang-Hoon Chai
- Issue Date
- 2007-02
- Citation
- International Solid-State Circuits Conference (ISSCC) 2007, pp.50-51
- Language
- English
- Type
- Conference Paper
- Abstract
- A selective internal reset mechanism that allows the burst-mode TIA to recover a burst-mode signal as a stand-alone device in EPON is discussed. Using step AGC, the TIA achieves a DR of 27dB and a sensitivity of -31dBm with a PIN photodiode. Moreover, with internal reset, the loud/soft ratio is also 27dB within 100ns guard and preamble times. ©2007 IEEE.
- KSP Keywords
- PIN photodiodes, burst mode, stand-alone device