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A statistical method for determining intrinsic electronic transport properties of self-assembled alkanethiol monolayer devices
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- Authors
- Hyun Wook Song, Tak Hee Lee, Nak-Jin Choi, Hyo Young Lee
- Issue Date
- 2007-12
- Citation
- Applied Physics Letters, v.91, no.25, pp.1-3
- ISSN
- 0003-6951
- Publisher
- American Institute of Physics (AIP)
- Language
- English
- Type
- Journal Article
- Abstract
- We present a statistical method to investigate the electronic transport of molecular devices. Electrical characterizations are performed with subsequent statistical analysis on 6745 molecular devices with nanometer-scale junction diameter. The comprehensive temperature-variable current-voltage measurements are also performed to elucidate the dominant charge conduction mechanism responsible for intrinsic molecular transport properties. The entity of data acquired represents a reliable basis for statistical analysis, which consequently provides an objective criterion to determine the most probable transport characteristics of molecular devices. © 2007 American Institute of Physics.
- KSP Keywords
- Alkanethiol monolayer, Current-Voltage measurements, Electrical characterization, Electronic transport properties, I-V characteristic(Transport property), Nanometer-scale, Statistical Analysis, Statistical methods, Transport characteristics, conduction mechanism, molecular devices