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Degradation Analysis in Asymmetric Sampled Grating Distributed Feedback Laser Diodes
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- Authors
- Han Sung Joo, Sang-Wan Ryu, Je Ha Kim, Il Gu Yun
- Issue Date
- 2007-06
- Citation
- Microelectronics Journal, v.38, no.6-7, pp.740-745
- ISSN
- 0026-2692
- Publisher
- Elsevier
- Language
- English
- Type
- Journal Article
- Abstract
- This paper presents the experimental observation of the degradation in asymmetric sampled grating DFB lasers by the accelerated life tests. Two degradation phenomena related to the electrical characteristics of LDs are observed during the tests. The first degradation phenomenon by increasing the reverse current is considered as a formation of leakage current path enough to prevent lasing operation in lateral blocking layer near active region of lasers. The second degradation phenomenon by decreasing the forward current is considered as activation of non-radiative Auger recombination process by thermal energy. It is also experimentally observed that the second degradation phenomenon is recovered after remained in room temperature with no electrical stress. Therefore, the criteria for LD reliability can be determined by observing the degradation of the reverse current-voltage characteristics. © 2007 Elsevier Ltd. All rights reserved.
- KSP Keywords
- Accelerated life test, Auger recombination, Current Path, DFB laser, Degradation phenomena, Distributed feedback laser diode, Distributed feedback lasers(DFBs), Forward current, Laser diode(LD), Leakage current, Non-radiative