상세정보
학술지
Degradation Analysis in Asymmetric Sampled Grating Distributed Feedback Laser Diodes
- 저자
- 주한성, 류상완, 김제하, 윤일구
- 발행일
- 200706
- 출처
- Microelectronics Journal, v.38 no.6-7, pp.740-745
- ISSN
- 0026-2692
- 출판사
- Elsevier
- 협약과제
- 07MB1100, 60GHz Pico cell 통신용 SoP, 유현규
- 초록
- This paper presents the experimental observation of the degradation in asymmetric sampled grating DFB lasers by the accelerated life tests. Two degradation phenomena related to the electrical characteristics of LDs are observed during the tests. The first degradation phenomenon by increasing the reverse current is considered as a formation of leakage current path enough to prevent lasing operation in lateral blocking layer near active region of lasers. The second degradation phenomenon by decreasing the forward current is considered as activation of non-radiative Auger recombination process by thermal energy. It is also experimentally observed that the second degradation phenomenon is recovered after remained in room temperature with no electrical stress. Therefore, the criteria for LD reliability can be determined by observing the degradation of the reverse current-voltage characteristics. © 2007 Elsevier Ltd. All rights reserved.
- KSP 제안 키워드
- Accelerated life test, Auger recombination, Current Path, DFB laser, Degradation phenomena, Distributed feedback laser diode, Distributed feedback lasers(DFBs), Forward current, Laser diode(LD), Leakage current, Non-radiative