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Journal Article Observation of Abrupt First-order Metal-insulator Transition in Be-doped GaAs
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Authors
Hyun-Tak Kim, Doo-Hyeb Youn, Byung-Gyu Chae, Kwang-Yong Kang, Yong-Sik Lim
Issue Date
2007-04
Citation
Journal of Crystal Growth, v.301-302, pp.252-255
ISSN
0022-0248
Publisher
Elsevier
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.1016/j.jcrysgro.2006.11.199
Abstract
An abrupt first-order metal-insulator transition (MIT) as a current jump is observed in Be-doped GaAs by inducing holes in a very low concentration of np ≈ 5 × 1014 cm- 3 into the valence band by the electric field; this is anomalous. In a higher hole-doping concentration of np ≈ 6 × 1016 cm- 3, the abrupt MIT is not observed at room temperature, but measured at a low temperature. The upper limit of the temperature allowing the MIT is deduced from experimental data to be approximately 440 K. The abrupt MIT is intrinsic and is compared with "breakdown" (an unsolved problem) produced by a high electric field in semiconductor devices. © 2006 Elsevier B.V. All rights reserved.
KSP Keywords
Doping concentration, Experimental Data, High electric field, Low concentration, Low temperature(LT), Room-temperature, Upper limit, first-order, hole doping, metal-insulator transition, semiconductor device