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Journal Article Structural Change and Its Electrooptical Effects on Terahertz Radiation with Post-Growth Annealing of Low-Temperature-Grown GaAs
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Authors
Doo-Hyeb Youn, Seong-Jin Kim, Gil-Ho Kim, Kwang-Yong Kang
Issue Date
2007-10
Citation
Japanese Journal of Applied Physics, v.46, no.10, pp.6514-6518
ISSN
0021-4922
Publisher
Japan Society of Applied Physics (JSAP), Institute of Physics (IOP)
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.1143/JJAP.46.6514
Project Code
07MB1400, Development of THz-wave oscillation/modulation/detection module and signal sources technology, Kang Kwang-Yong
Abstract
This paper investigate how post-growth annealing of low-temperature grown GaAs (LT-GaAs) affects, the structural changes induced by the generation of point defects, as well as strain relaxation, the intensity and coarsening of As clusters with annealing, and the carrier recombination lifetime. The intensity and coarsening of As clusters is revealed by the analysis of bright field and high-resolution transmission electron microscopy (HR-TEM). The structural change is determined by the analysis of the intensity as well as a satellite reflection and a peak shift of the X-ray Bragg reflection. The investigation of the defect structures and the carrier lifetime change in the LT-GaAs are based on measurements of HR-TEM, X-ray, Hall, and terahertz spectrum. A systematic study of as-grown and post-growth annealed LT-GaAs reveals that the carrier lifetime is directly related to the intensity and distance of the As clusters. The electrical resistance of the LT-GaAs increases as the annealing temperature increases. A post-growth annealing condition was investigated for emitting and detecting terahertz signals and a photoconductive type dipole antenna was fabricated on the LT-GaAs. © 2007 The Japan Society of Applied Physics.
KSP Keywords
Annealing conditions, Annealing temperature, Applied physics, As clusters, As-grown, Bragg reflection, Bright field, Carrier Recombination, Dipole antenna, Electrical Resistance, HR-TEM