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학술대회 Analytical Modeling of IGZO Thin Film Transistors Based on the Exponential Deep and Tail States
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저자
신재헌, 황치선, 정우석, 박상희, 조두희, 유민기, 윤성민, 변춘원, 양신혁, 추혜용, 조경익
발행일
200801
출처
International Thin-Film Transistor Conference (ITC) 2008, pp.197-198
협약과제
07MB2900, 투명전자 소자를 이용한 스마트 창, 조경익
초록
We demonstrate that the curent-voltage (I-V) characteristics of In-Ga-Zn-O (IGZO) thin-film transistors (TFTs) can be modeled by using the well-known physical model based on the exponential density of deep and tail states. The threshold voltage and the voltage-dependent field-effect mobility can be determined without ambiguity by using the newly proposed scheme. Both the transfer and the output curves of the device are wel reproduced by using the proposed modeling scheme with the obtained parameters.
KSP 제안 키워드
Analytical Modeling, IGZO thin film, In-Ga-Zn-O(IGZO), Initialization Vector(IV), Physical model, Thin-Film Transistor(TFT), field-effect mobility, model-based, tail states, thin film(TF), threshold voltage(Vth)