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Journal Article
Correlation between Micrometer-Scale Ripple Alignment and Atomic-Scale Crystallographic Orientation of Monolayer Graphene
- Authors
- Jin Sik Choi, Young Jun Chang, Sungjong Woo, Young-Woo Son, Yeonggu Park, Mi Jung Lee, Ik-Su Byun, Jin-Soo Kim, Choon-Gi Choi, Aaron Bostwick, Eli Rotenberg, Bae Ho Park
- Issue Date
- 2014-12
- Citation
- Scientific Reports, v.4, pp.1-5
- ISSN
- 2045-2322
- Publisher
- Nature Publishing Group
- Language
- English
- Type
- Journal Article
- Abstract
- Deformation normal to the surface is intrinsic in two-dimensional materials due to phononic thermal fluctuations at finite temperatures. Graphene's negative thermal expansion coefficient is generally explained by such an intrinsic property. Recently, friction measurements on graphene exfoliated on a silicon oxide surface revealed an anomalous anisotropy whose origin was believed to be the formation of ripple domains. Here, we uncover the atomistic origin of the observed friction domains using a cantilever torsion microscopy in conjunction with angle-resolved photoemission spectroscopy. We experimentally demonstrate that ripples on graphene are formed along the zigzag direction of the hexagonal lattice. The formation of zigzag directional ripple is consistent with our theoretical model that takes account of the atomic-scale bending stiffness of carbon-carbon bonds and the interaction of graphene with the substrate. The correlation between micrometer-scale ripple alignment and atomic-scale arrangement of exfoliated monolayer graphene is first discovered and suggests a practical tool for measuring lattice orientation of graphene.
- KSP Keywords
- Atomic scale, Bending stiffness, Carbon-carbon, Crystallographic orientation, Finite temperatures, Intrinsic property, Lattice orientation, Monolayer graphene, Negative thermal expansion coefficient, Oxide surface, Silicon oxide
This work is distributed under the term of Creative Commons License (CCL)
(CC BY NC ND)
(CC BY NC ND)
