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학술대회 Highly Stable ZnO TFT: Effect of Substrate Buffer Layer
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저자
박상희, 황치선, 유민기, 신재헌, 양신혁, 윤성민, 추혜용
발행일
200810
출처
The Electrochemical Society (ECS) Meeting 2008, pp.297-302
DOI
https://dx.doi.org/10.1149/1.2980566
협약과제
08MB2100, 투명전자 소자를 이용한 스마트 창, 조경익
초록
We presented effect of substrate buffer layer on the staggered ZnO TFT performance. Thermal oxide with smooth surface and negligible hydrogen amount forms good back channel with the ZnO active layer deposited by PEALD to result in high performance of ZnO TFT. On the other hand, PECVD SiO2 buffer layer generates some defects in the back channel and make PEALD ZnO have higher carrier density to result in much negatively shifted Von and reduced mobility of TFT. ZnO TFT having sputtered SiO2 as a buffer layer showed similar performance to that with thermal oxide. ©The Electrochemical Society.
KSP 제안 키워드
Active Layer, Buffer layer, Carrier density, High performance, Highly stable, Reduced mobility, Smooth surface, Thermal oxide, back channel