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Conference Paper Top Electrode Dependence on Resistance Switching Properties of Metal/TiOx/Al Memory Devices
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Authors
Hu Young Jeong, Sung-Yool Choi
Issue Date
2008-11
Citation
International Conference on Nano Science and Nano Technology (GJ-NST) 2008, pp.1-1
Language
English
Type
Conference Paper
KSP Keywords
Resistance switching, Switching properties, memory device, top electrode
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