ETRI-Knowledge Sharing Plaform

ENGLISH

성과물

논문 검색
구분 SCI
연도 ~ 키워드

상세정보

학술지 Properties of Ferroelectric P(VDF-TrFE) 70/30 Copolymer Films as a Gate Dielectric
Cited 20 time in scopus Download 0 time Share share facebook twitter linkedin kakaostory
저자
정순원, 윤성민, 강승열, 유병곤
발행일
200812
출처
Integrated Ferroelectrics, v.100 no.1, pp.198-205
ISSN
1058-4587
출판사
Taylor & Francis
DOI
https://dx.doi.org/10.1080/10584580802541106
협약과제
08IB2100, 강유전체 박막재료의 특성연구, 유병곤
초록
We directly formed the organic ferroelectric P(VDF-TrFE) 70/30 copolymer film by the spin coating for making the MFS structure in the silicon wafer. To understand the crystallization behavior of P(VDF-TrFE) 70/30 copolymer, the morphologies of copolymer thin films were studied by AFM and XRD. AFM studies revealed that as grown and annealed films showed surface roughness greater than amorphous films due to crystallization. The XRD spectrum of the films subjected to various annealing temperatures showed 棺-phase and this phase content was maximum at 140°C annealing. The capacitance shows hysteresis behavior like a buttery shape due to the polarization reversal in the film and this result indicates clearly that the film has a ferroelectric property. The dielectric constants of the P(VF2-TrFE) copolymer films calculated from the capacitance at the two peak points of the C-V characteristics were about 8.7. Copyright © Taylor & Francis Group, LLC.
KSP 제안 키워드
AFM studies, Amorphous films, Annealed films, Annealing temperature, C-V characteristics, Computer Vision(CV), Copolymer films, Copolymer thin films, Crystallization behavior, Dielectric Constant, Ferroelectric properties