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A Resistance Deviation-to-Time Interval Converter for Resistive Sensors
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- Authors
- Ji Man Park, Sung Ik Jun
- Issue Date
- 2009-09
- Citation
- International SOC Conference (SOCC) 2008, pp.101-104
- Publisher
- IEEE
- Language
- English
- Type
- Conference Paper
- Abstract
- A resistance deviation-to-time interval converter is presented for interfacing resistive sensors. It consists of two voltage-sources, a ramp integrator, a pair of comparator, and two logic gates. The proposed converter was designed and built on 0.35 μm CMOS process. The prototype circuit exhibits a resolution as high as 13 bits, a linearity error less than 짹 0.1%, and environmentindependent signal stability, when the output pulse is counted by 20 MHz clock signal. Moreover, the circuit complexity becomes quite simple and can be implemented in a very small space. One possible application of the proposed converter is found in a system based on any resistive-sensor like a physical contact or temperature sensor. ©2008 IEEE.
- KSP Keywords
- CMOS Process, Circuit complexity, Logic gate, Physical contact, Resistive Sensors, Time interval, clock signal, linearity error, signal stability, temperature sensor(LM35)