상세정보
학술대회
A Resistance Deviation-to-Time Interval Converter for Resistive Sensors
- 발행일
- 200909
- 출처
- International SOC Conference (SOCC) 2008, pp.101-104
- 출판사
- IEEE
- 협약과제
- 08MS2500, 차세대 모바일 단말기의 보안 및 신뢰 서비스를 위한 공통 보안 핵심 모듈 개발, 전성익
- 초록
- A resistance deviation-to-time interval converter is presented for interfacing resistive sensors. It consists of two voltage-sources, a ramp integrator, a pair of comparator, and two logic gates. The proposed converter was designed and built on 0.35 μm CMOS process. The prototype circuit exhibits a resolution as high as 13 bits, a linearity error less than 짹 0.1%, and environmentindependent signal stability, when the output pulse is counted by 20 MHz clock signal. Moreover, the circuit complexity becomes quite simple and can be implemented in a very small space. One possible application of the proposed converter is found in a system based on any resistive-sensor like a physical contact or temperature sensor. ©2008 IEEE.
- KSP 제안 키워드
- CMOS Process, Circuit complexity, Logic gate, Physical contact, Resistive Sensors, Time interval, clock signal, linearity error, signal stability, temperature sensor(LM35)