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Micro X-Ray Diffraction Study in VO2 Films - Separation between Metal-Insulator Transition and Structural Phase Transition
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- Issue Date
- 2008-06
- Citation
- Physical Review B : Condensed Matter and Materials Physics, v.77, no.23, pp.1-18
- ISSN
- 1098-0121
- Publisher
- American Physical Society(APS)
- Language
- English
- Type
- Journal Article
- Abstract
- In order to clarify whether VO2 is a Mott insulator or a Peierls insulator, the metal-insulator transition (MIT) and the structural phase transition (SPT) are simultaneously monitored for VO2 films by current-voltage curve and diffraction measurements using a synchrotron micro-x-ray beam. In the regime showing a metallic conductivity below the SPT temperature (approximately 70°C), only the diffraction planes of the monoclinic structure are observed, while planes of the tetragonal structure are absent. This observation reveals the presence of a monoclinic and metal phase between the MIT and the SPT as a characteristic of a Mott insulator. © 2008 The American Physical Society.
- KSP Keywords
- Metal phase, Mott insulator, Tetragonal structure, X-ray diffraction study, current-voltage curve, metal-insulator transition, metallic conductivity, monoclinic structure, structural phase transition