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Polaron Localization at Interfaces in High-Mobility Microcrystalline Conjugated Polymers
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- Authors
- N. Zhao, Y.-Y. Noh, J.-F. Chang, M. Heeney, I. McCulloch, H. Sirringhaus
- Issue Date
- 2009-05
- Citation
- Advanced Materials, v.21, no.37, pp.3759-3763
- ISSN
- 0935-9648
- Publisher
- WILEY-VCH Verlag GmbH & Co. KGaA
- Language
- English
- Type
- Journal Article
- Project Code
- 09IC1900, Development of Next Generation RFID Technology for Item Level Applications, Chae Jong- Suk
- Abstract
- The charge-induced optical absorptions of two-dimensional polarons in semicrystalline, high-mobility conjugated polymers are investigated as a function of distance from an interface with polymer gate dielectrics of different dielectric constants. For high-k dielectrics, polarons in the accumulation layer at the interface are found to be more localized than those in the bulk. © 2009 WILEY-VCH Verlag GmbH & Co. KGaA.
- KSP Keywords
- Accumulation layer, Co. KGaA, Conjugated polymer(PFO-co-MEH-PPV), Dielectric Constant, High Mobility, High-k Dielectric, at interfaces, polaron localization, polymer gate dielectrics, two-dimensional(2D)