ETRI-Knowledge Sharing Plaform

ENGLISH

성과물

논문 검색
구분 SCI
연도 ~ 키워드

상세정보

학술대회 Center Wavelength Uniformity of Shallow-Etched Silicon Photonic Wire AWG
Cited 0 time in scopus Download 0 time Share share facebook twitter linkedin kakaostory
저자
김덕준, 표정형, 김경옥
발행일
200909
출처
International Conference on Group IV Photonics (GFP) 2009, pp.128-130
출판사
IEEE
DOI
https://dx.doi.org/10.1109/GROUP4.2009.5338313
협약과제
09MB1100, 실리콘 기반 초고속 광인터커넥션 IC, 김경옥
초록
We have fabricated a WDM device consisting of two or three shallow-etched AWGs on 5-inch SOI wafer. The center wavelength difference between the closely located AWGs was smaller than 1 nm. Meanwhile, the center wavelength deviation over the whole wafer was larger than 5 nm. ©2009 IEEE.
KSP 제안 키워드
5 nm, Center wavelength, Etched silicon, Photonic wire, Silicon photonics, Soi wafer, wavelength deviation