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Conference Paper Device Design Schemes and Electrical Characterization of Nonvolatile Memory Thin-Film Transistors with the Gate Structure of Al/P(VDF-TrFE)/Al2O3/ZnO
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Authors
Sung Min Yoon, Shin Hyuk Yang, Sang Hee Ko Park, Soon Won Jung, Chun Won Byun, Doo Hee Cho, Seung Youl Kang, Chi Sun Hwang, Byoung Gon Yu
Issue Date
2009-10
Citation
International Conference on Solid State Devices and Materials (SSDM) 2009, pp.280-281
Language
English
Type
Conference Paper
Project Code
09MB2900, Smart window with transparent electronic devices, Cho Kyoung Ik
KSP Keywords
Electrical characterization, Non-Volatile Memory(NVM), Thin-Film Transistor(TFT), VDF-TrFE, device design, thin film(TF)