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Magnetic Instability of Giant Magnetoresistance Spin-Valves due to Electromigrationinduced Inter-Diffusion
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- Authors
- Jing Jiang, Seong Tae Bae, Ho Jun Ryu
- Issue Date
- 2009-07
- Citation
- Thin Solid Films, v.517, no.18, pp.5557-5562
- ISSN
- 0040-6090
- Publisher
- Elsevier
- Language
- English
- Type
- Journal Article
- Abstract
- Electromigration-induced magnetic failures in NiFe/(Co)/Cu/(Co)/NiFe spin-valve (SV) multilayers have been investigated. Electrically stressed NiFe/Cu/NiFe SV multilayers showed a dramatic reduction of magnetic moment up to 41%, and a shift of interlayer coupling characteristics, while no obvious magnetic degradation was observed in the NiFe/Co/Cu/Co/NiFe SV multilayers. It was experimentally confirmed that the magnetic degradation of the NiFe/Cu/NiFe SV multilayers is primarily due to the formation of Ni-Cu intermixing caused by the electromigration-induced Cu spacer inter-diffusion. Furthermore, it was demonstrated that an ultra thin Co diffusion barrier at the NiFe/Cu interface is promisingly effective to improve the magnetic stability of NiFe/(Co)/Cu/(Co)/NiFe SV multilayers against electromigration. © 2009 Elsevier B.V. All rights reserved.
- KSP Keywords
- Co diffusion, Coupling Characteristics, Cu spacer inter-diffusion, Diffusion barrier(DB), Giant magnetoresistance(GMR), Magnetic moment, Ni-Cu, Spin valve, Spin valves, Ultra-thin, interlayer coupling