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Distinction of [220] and [204] Textures of Cu(In,Ga)Se2 Film and their Growth Behaviors Depending on Substrate Nature and Na Incorporation
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- Authors
- Dae-Hyung Cho, Jeha Kim, Yong-Duck Chung
- Issue Date
- 2015-08
- Citation
- Thin Solid Films, v.589, pp.309-314
- ISSN
- 0040-6090
- Publisher
- Elsevier
- Language
- English
- Type
- Journal Article
- Abstract
- For better understanding of the structural property of polycrystalline tetragonal Cu(In,Ga)Se2 (CIGS) thin films grown on soda-lime glass, it is necessary to characterize the [220]- and [204]-oriented textures clearly that are related to the different physical properties. However, the distinction between the [220]- and [204]-oriented textures is very difficult because of their nearly identical plane spacings and atomic arrangements. Using X-ray diffraction techniques of high resolution 罐-2罐 scanning and reciprocal space mapping, we distinguished the [220]- and [204]-oriented textures of CIGS films and observed that the behaviors of [220] and [204] textures independently depended on both substrate nature and Na presence. We report the Na- and substrate-related dependence of the physical properties of the CIGS film was attributed to the independent growth behaviors of the [220] and [204] textures in the CIGS.
- KSP Keywords
- CIGS film, Growth behavior, High resolution, Na incorporation, Physical Properties, Reciprocal space mapping, Soda lime glass(SLG), X-ray diffraction techniques, oriented textures, structural properties, thin film(TF)