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Journal Article Comment on ‘Enhancement in hardness and transmittance of ZnS via SiO2/Y2O3 multilayer’
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Authors
Yong-Duck Chung, Dae-Hyung Cho, Sung-Bock Kim, Won Seok Han
Issue Date
2016-04
Citation
Journal of Alloys and Compounds, v.664, pp.648-649
ISSN
0925-8388
Publisher
Elsevier
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.1016/j.jallcom.2015.12.206
Abstract
In a recent paper [1], Huayu Zhang et al. reported data on the enhancement in hardness and transmittance of ZnS via SiO2/Y2O3 multilayer. In particular, the authors discussed the chemical state of sputtered Y2O3 on SiO2/ZnS measured by X-ray photoelectron spectroscopy. We suggested that the split spectrum of Y 3d doublet should be decomposed into the sum of the doublet and the exact notation of O 1s level should be applied. The O 1s of 528.8 eV could also be assigned to Y2O3 and the O 1s of 531.5 eV could be assigned to Si related compound.
KSP Keywords
Chemical states, O 1s, X-Ray Photoelectron Spectroscopy