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학술지 Doping-Concentration-Dependent Electric and Thermoelectric Properties of 2-Dimensional Silicon Thin Films
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저자
김준수, 김수정, 권정윤, 최원철, 김혁진, 김태광, 임솔이, 이재우, 이승민, 장문규, 문승언
발행일
201606
출처
Journal of the Korean Physical Society, v.68 no.12, pp.1472-1475
ISSN
0374-4884
출판사
한국물리학회
DOI
https://dx.doi.org/10.3938/jkps.68.1472
협약과제
16PB1200, 고상 전자냉각용 다결정 열전소재 개발, 문승언
초록
To study the electric and the thermoelectric properties of silicon thin films (SiTFs), we fabricated devices having SiTFs by using conventional complementary metal-oxide-semiconductor (CMOS)-compatible processes for mass production and extendibility. The conductivities and the Seebeck coefficients of SiTFs for dose concentrations of 5 × 1014 cm -2, 1 × 1015 cm -2 and 5 × 1015 cm -2 and for temperatures in the range of 310 to 430 K were measured by using homemade setup. The measured power factors of the SiTFs showed a slight increasing tendency with increasing measurement temperature and were maximum at a dose concentration of 1 × 1015 cm -2 for both n- and p-type films at 330 K.
KSP 제안 키워드
Complementary metal-oxide-semiconductor(CMOS), Metal-oxide(MOX), Power factor(P.F), Seebeck coefficient, Silicon thin film, mass production, p-Type, thermoelectric properties, thin film(TF)