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Journal Article Simplified Small Exponent Test for Batch Verification
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Authors
Jung Yeon Hwang, Boyeon Song, Daeseon Choi, Seung-Hun Jin, Hyun Sook Cho, Mun-Kyu Lee
Issue Date
2017-02
Citation
Theoretical Computer Science, v.662, pp.48-58
ISSN
0304-3975
Publisher
Elsevier
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.1016/j.tcs.2016.12.017
Project Code
16MH1500, Development of Universal Platform Technology with Context-Awareness Multi-Factor Authentication and Digital Signature, Soo Hyung Kim
Abstract
The Small Exponent Test (SET) for exponentiation is an essential batch-verification technique that is widely applied. In this paper, we propose a simplified SET that can securely batch-verify n instances with only n?닋1 randomizing exponents. We show that the structure of the proposed batch test is compact in the sense that it works with a minimal number of randomizing exponents for the SET. Thus, our test offers various advantages. Overall, compared to the original SET, the proposed simplified SET is more efficient for any sized batch instance. In particular, unlike the SET, our proposal performs well even when the size of a batch instance is small, e.g., n=1,2,3, and 4. This feature can be also used to significantly reduce pairing computations in a signature scheme where several pairing equations are verified. In addition, our test can be combined easily and generically with existing batch techniques such as the use of sparse exponents, the bucket test for large batch sizes, or an automated tool to generate a batch algorithm. Finally, with our simplified test, an efficient identification algorithm can be constructed to discover incorrect instances in a batch.
KSP Keywords
Automated tool, Batch Verification, Batch test, Pairing computation, Signature scheme, identification algorithm