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학술지 De-Embedding Method-based Electrical Resistivity Characterisation Scheme for a Small Brittle Pillar-Shaped Material
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저자
이재우, 김준수, 임솔이, 권정윤, 임종필, 이승민, 문승언
발행일
201707
출처
Electronics Letters, v.53 no.14, pp.930-931
ISSN
0013-5194
출판사
IET
DOI
https://dx.doi.org/10.1049/el.2017.1508
협약과제
17PB1200, 고상 전자냉각용 다결정 열전소재 개발, 문승언
초록
An electrical resistivity evaluation method for a pillar-shaped solid material, especially a brittle thermoelectric Bi2Te3, is presented with short compensation based on a probing apparatus with four-spring pins. The method eliminates the process of modelling a complex contact resistance, resulting in a simple but reproducible characterisation without any contamination on the surface in comparison to either a conventional paste or welding contact. Furthermore, it enables a small electrical or thermoelectric material <2 mm thick to be appropriately evaluated, which can erect and align a pillar-shaped material with electrical terminals, in spite of a small surface area. To extract the resistivity of a Bi2Te3 pillar with the volume of 2 × 2 × 1.6 mm, Alumina 6061-T6 material identical with that of Bi2Te3 was used as a reference material for the short compensation. Thus, the modelled resistance and its resistivity were 2.46 짹 0.11 m廓 and 6.15 짹 0.28 廓-μm, respectively, in the range of 2-10 kHz, demonstrating the validity of the method.
KSP 제안 키워드
2 mm, 6061-T6, Contact resistance(73.40.Cg), De-embedding method, Evaluation method, Reference material, Solid material, Surface Area, electrical resistivity, thermoelectric materials