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Conference Paper A Novel Technique for Fault and Lifetime Self-Diagnosis of Closed Transition Transfer Switch using Dual Lines
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Authors
Sewan Heo, Wan-Ki Park, Ilwoo Lee
Issue Date
2017-06
Citation
Pulsed Power Conference (PPC) 2017, pp.1-6
Language
English
Type
Conference Paper
DOI
https://dx.doi.org/10.1109/PPC.2017.8291189
Project Code
17ZH1400, Development of Energy Sharing Networking for Zero-Energy Community, Lee Il Woo
Abstract
This paper proposes a dual-line closed transition transfer switch (CTTS) and a technique for fault and lifetime self-diagnosis. The proposed system consists of the dual-line CTTS, a closed transition operator, active and inactive channel inspectors that extract the switch characteristics, and a self-diagnosis block for fault and lifetime of the switch using the characteristics. The system controller coordinates the inspection and diagnosis based on a schedule. The proposed dual-line CTTS and self-diagnosis were verified by the PSIM simulator. The closed transition was successful although the frequencies of the two sources were different. During the inspection using the current and voltage of each phase, the signal variation was detected fast so the switch characteristics and even fault problem were detected fast as well.
KSP Keywords
Closed transition transfer switch, Novel technique, inspection and diagnosis, self-diagnosis