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Journal Article 80 μW/MHz, 850 MHz Fault Tolerant Processor with Fault Monitor Systems
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Authors
Jinho Han, Youngsu Kwon, Kyeongsun Shin, Hoi-Jun Yoo
Issue Date
2017-10
Citation
Journal of Semiconductor Technology and Science, v.17, no.5, pp.627-635
ISSN
1598-1657
Publisher
대한전자공학회 (IEIE)
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.5573/JSTS.2017.17.4.627
Abstract
The processor is becoming increasingly susceptible to transient faults with fluctuating voltage, widening operating temperature, and increasing clock frequency. Especially, processor, operating near threshold voltage for a low power, can expose to transient faults with the thin margin of process, voltage, and temperature. This paper presents a fault tolerant processor having on-chip fault monitor systems for processor core and cache, which detects faults and corrects faults, and a fault injector which injects faults for testing. The fault tolerant feature is analyzed by a fault injection and quantitative analysis complying with ISO26262 standard. As a result, the proposed work achieves 80 쨉W/MHz energy efficiency, 850 MHz maximum frequency, 72% fault trap reduction, and 99.23% single point fault failure rate complying with ISO26262.
KSP Keywords
Clock frequency, Energy efficiency, Fault injector, Fault tolerant, Maximum Frequency, Near Threshold Voltage, Operating Temperature, Processor core, Quantitative analysis, Single point, Transient faults