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Journal Article 80 μW/MHz, 850 MHz Fault Tolerant Processor with Fault Monitor Systems
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Authors
Jinho Han, Youngsu Kwon, Kyeongsun Shin, Hoi-Jun Yoo
Issue Date
2017-10
Citation
Journal of Semiconductor Technology and Science, v.17, no.5, pp.627-635
ISSN
1598-1657
Publisher
대한전자공학회 (IEIE)
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.5573/JSTS.2017.17.4.627
Abstract
The processor is becoming increasingly susceptible to transient faults with fluctuating voltage, widening operating temperature, and increasing clock frequency. Especially, processor, operating near threshold voltage for a low power, can expose to transient faults with the thin margin of process, voltage, and temperature. This paper presents a fault tolerant processor having on-chip fault monitor systems for processor core and cache, which detects faults and corrects faults, and a fault injector which injects faults for testing. The fault tolerant feature is analyzed by a fault injection and quantitative analysis complying with ISO26262 standard. As a result, the proposed work achieves 80 쨉W/MHz energy efficiency, 850 MHz maximum frequency, 72% fault trap reduction, and 99.23% single point fault failure rate complying with ISO26262.