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Journal Article Atmospheric Pressure Plasma Polymerization Synthesis and Characterization of Polyaniline Films Doped with and without Iodine
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Authors
Choon-Sang Park, Eun Young Jung, Dong Ha Kim, Do Yeob Kim, Hyung-Kun Lee, Bhum Jae Shin, Dong Ho Lee, Heung-Sik Tae
Issue Date
2017-11
Citation
Materials, v.10, no.11, pp.1-16
ISSN
1996-1944
Publisher
MDPI AG
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.3390/ma10111272
Abstract
Although polymerized aniline (polyaniline, PANI) with and without iodine (I2) doping has already been extensively studied, little work has been done on the synthesis of PANI films using atmospheric pressure plasma (APP) deposition. Therefore, this study characterized pure and I2-doped PANI films synthesized using an advanced APP polymerization system. The I2 doping was conducted ex-situ and using an I2 chamber method following the APP deposition. The pure and I2-doped PANI films were structurally analyzed using field emission scanning electron microscope (FE-SEM), atomic force microscope (AFM), X-ray Diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR), X-ray photoelectron spectroscopy (XPS), and time of flight secondary ion mass spectrometry (ToF-SIMS) studies. When increasing the I2 doping time, the plane and cross-sectional SEM images showed a decrease in the width and thickness of the PANI nanofibers, while the AFM results showed an increase in the roughness and grain size of the PANI films. Moreover, the FT-IR, XPS, and ToF-SIMS results showed an increase in the content of oxygen-containing functional groups and C=C double bonds, yet decrease in the C-N and C-H bonds when increasing the I2 doping time due to the reduction of hydrogen in the PANI films via the I2. To check the suitability of the conductive layer for polymer display applications, the resistance variations of the PANI films grown on the interdigitated electrode substrates were also examined according to the I2 doping time.
KSP Keywords
Atmospheric pressure plasma polymerization, Atomic force microscope(AFM), Cluster Head(CH), Complex Networks(CN), Conductive layer, Cross-sectional, Display applications, Ex-situ, Fourier Transform Infrared Spectroscopy(FTIR), Grain size, H bond
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