ETRI-Knowledge Sharing Plaform

KOREAN
논문 검색
Type SCI
Year ~ Keyword

Detail

Journal Article Power Semiconductor SMD Package Embedded in Multilayered Ceramic for Low Switching Loss
Cited 11 time in scopus Download 193 time Share share facebook twitter linkedin kakaostory
Authors
Dong Yun Jung, Hyun Gyu Jang, Minki Kim, Chi-Hoon Jun, Junbo Park, Hyun-Soo Lee, Jong Moon Park, Sang Choon Ko
Issue Date
2017-12
Citation
ETRI Journal, v.39 no.6, pp.866-873
ISSN
1225-6463
Publisher
한국전자통신연구원 (ETRI)
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.4218/etrij.17.0117.0113
Project Code
16MB2400, Next Generation High Efficiency 3-Dimensional Convergence Power Conversion Module, Sang Choon Ko
Abstract
We propose a multilayered-substrate-based power semiconductor discrete device package for a low switching loss and high heat dissipation. To verify the proposed package, cost-effective, low-temperature co-fired ceramic, multilayered substrates are used. A bare die is attached to an embedded cavity of the multilayered substrate. Because the height of the pad on the top plane of the die and the signal line on the substrate are the same, the length of the bond wires can be shortened. A large number of thermal vias with a high thermal conductivity are embedded in the multilayered substrate to increase the heat dissipation rate of the package. The packaged silicon carbide Schottky barrier diode satisfies the reliability testing of a high-temperature storage life and temperature humidity bias. At 175 C, the forward current is 7 A at a forward voltage of 1.13 V, and the reverse leakage current is below 100 μA up to a reverse voltage of 980 V. The measured maximum reverse current (IRM), reverse recovery time (Trr), and reverse recovery charge (Qrr) are 2.4 A, 16.6 ns, and 19.92 nC, respectively, at a reverse voltage of 300 V and di/dt equal to 300 A/μs.
KSP Keywords
3 V, Embedded Cavity, Forward current, Forward voltage, Heat dissipation rate, High temperature storage, Low Temperature Cofired Ceramic(LTCC), Low temperature(LT), Power semiconductor, Reverse leakage current, Reverse voltage
This work is distributed under the term of Korea Open Government License (KOGL)
(Type 4: : Type 1 + Commercial Use Prohibition+Change Prohibition)
Type 4: