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Conference Paper
High Temperature Characterization and Analysis of GaN-on-Diamond FETs
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- Authors
- Hyung-Seok Lee, Zin-Sig Kim, Seong-Bum Bae, Eunsoo Nam, Jae-Kyoung Mun, Jeong-Jin Kim, Jong-Won Lim
- Issue Date
- 2018-02
- Citation
- 한국 반도체 학술 대회 (KCS) 2018, pp.665-666
- Language
- English
- Type
- Conference Paper
- KSP Keywords
- GaN-on-diamond, High temperature characterization