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Conference Paper High Temperature Characterization and Analysis of GaN-on-Diamond FETs
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Authors
Hyung-Seok Lee, Zin-Sig Kim, Seong-Bum Bae, Eunsoo Nam, Jae-Kyoung Mun, Jeong-Jin Kim, Jong-Won Lim
Issue Date
2018-02
Citation
한국 반도체 학술 대회 (KCS) 2018, pp.665-666
Language
English
Type
Conference Paper
KSP Keywords
GaN-on-diamond, High temperature characterization