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Journal Article Facile Dry Surface Cleaning of Graphene by UV Treatment
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Authors
Jin Hong Kim, Mohd Musaib Haidari, Jin Sik Choi, Hakseong Kim, Young-Jun Yu, Jonghyurk Park
Issue Date
2018-05
Citation
Journal of the Korean Physical Society, v.72, no.9, pp.1045-1051
ISSN
0374-4884
Publisher
한국물리학회 (KPS)
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.3938/jkps.72.1045
Abstract
Graphene has been considered an ideal material for application in transparent lightweight wearable electronics due to its extraordinary mechanical, optical, and electrical properties originating from its ordered hexagonal carbon atomic lattice in a layer. Precise surface control is critical in maximizing its performance in electronic applications. Graphene grown by chemical vapor deposition is widely used but it produces polymeric residue following wet/chemical transfer process, which strongly affects its intrinsic electrical properties and limits the doping efficiency by adsorption. Here, we introduce a facile dry-cleaning method based on UV irradiation to eliminate the organic residues even after device fabrication. Through surface topography, Raman analysis, and electrical transport measurement characteristics, we confirm that the optimized UV treatment can recover the clean graphene surface and improve graphene-FET performance more effectively than thermal treatment. We propose our UV irradiation method as a systematically controllable and damage-free post process for application in large-area devices.
KSP Keywords
Chemical Vapor Deposition, Dry surface, Electrical transport measurement, Organic residues, Post process, Raman analysis, Surface Cleaning, Surface Topography, Thermal treatments, UV irradiation, UV treatment