Laser-Assisted Bonding with Compression (LABC) technology with NCF was proposed to accomplish the productivity and process reliability at the same time. A quartz block as a header was used to deliver a pressure to the devices because of its extremely low absorption of the laser during the bonding process. Newly developed NCF for LABC was designed to have stability on a hot stage and to show solder wetting and fast curing with no void and optimal fillet during the LABC bonding process. As the laser is used as a heat source, the uniform heat should be provided on each interconnection without any damages on chip or a substrate. 780μ-Thick daisy chain top and bottom chips with the minimum pitch of 30m and bump number of about 27, 000 were successfully bonded using the LABC and NCF film.
KSP Keywords
3D IC Integration, Bonding process, Fast curing, Heat source, Hot stage, Laser-Assisted Bonding, Process reliability, daisy chain
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