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Conference Paper Reliability-Enhanced Test Pattern Scheme for Holographic Display Measurement
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Authors
J Nam, J Kim
Issue Date
2019-09
Citation
International Display Research Conference (EuroDisplay) 2019, pp.1-1
Language
English
Type
Conference Paper
Project Code
19MR1400, Development of Telecommunications Terminal with Digital Holographic Table-top Display, Jin Woong Kim
KSP Keywords
holographic display, test pattern
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