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Conference Paper G03-1728 - Impact of Passivation System on Device Performance and Proton Radiation Hardness in GaN-Based MIS-HEMTs
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Authors
Sung-Jae Chang, Hyun-Wook Jung, Kyu Jun Cho, Soo Cheol Kang, Youn Sub NOH, Sang-Heung Lee, Seong-il Kim, Hae Cheon Kim, Hokyun Ahn, Jong-Won Lim
Issue Date
2020-10
Citation
PRiME 2020, pp.1-3
Publisher
ECS
Language
English
Type
Conference Paper
KSP Keywords
GaN-Based, Radiation hardness, device performance, proton radiation