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Conference Paper Selecting Test Inputs for DNNs using Differential Testing with Subspecialized Model Instances
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Authors
Yu-Seung Ma, Shin Yoo, Taeho Kim
Issue Date
2021-08
Citation
ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE) 2021, pp.1467-1470
Publisher
ACM
Language
English
Type
Conference Paper
DOI
https://dx.doi.org/10.1145/3468264.3473131
Abstract
Testing of Deep Learning (DL) models is difficult due to the lack of automated test oracle and the high cost of human labelling. Differential testing has been used as a surrogate oracle, but there is no systematic guide on how to choose the reference model to use for differential testing. We propose a novel differential testing approach based on subspecialized models, i.e., models that are trained on sliced training data only (hence specialized for the slice). A preliminary evaluation of our approach with an CNN-based EMNIST image classifier shows that it can achieve higher error detection rate with selected inputs compared to using more advanced ResNet and LeNet as the reference model for differential testing. Our approach also outperforms N-version testing, i.e., the use of the same DL model architecture trained separately but using the same data.
KSP Keywords
Automated Test, DL model, Differential testing, Error Detection Rate, Image classifier, Model architecture, N-version, Preliminary evaluation, Reference model, Test oracle, deep learning(DL)