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학술지 Impacts of Residual Self-Interference, Hardware Impairment and Cascade Rayleigh Fading on the Performance of Full-Duplex Vehicle-to-Vehicle Relay Systems
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저자
Ba Cao Nguyen, Le The Dung, Huu Minh Nguyen, 김태준, 김영일
발행일
202108
출처
Sensors, v.21 no.16, pp.1-15
ISSN
1424-8220
출판사
MDPI
DOI
https://dx.doi.org/10.3390/s21165628
협약과제
21NR1100, 소음 및 영상신호 결합기반 무인기 검출 기술 개발, 김영일
초록
In practice, self-interference (SI) in full-duplex (FD) wireless communication systems cannot be completely eliminated due to imperfections in different factors, such as the SI channel estimation and hardware circuits. Therefore, residual SI (RSI) always exists in FD systems. In addition, hardware impairments (HIs) cannot be avoided in FD systems due to the non-ideal characteristics of electronic components. These issues motivate us to consider an FD-HI system with a decode-and-forward (DF) relay that is applied for vehicle-to-vehicle (V2V) communication. Unlike previous works, the performance of the proposed FD-HI-V2V system is evaluated over cascaded Rayleigh fading channels (CRFCs). We mathematically obtain the exact closed-form expressions of the outage probability (OP), system throughput (ST), and ergodic capacity (EC) of the proposed FD-HI-V2V system under the joint and crossed effects of the RSI, HIs, and CRFCs. We validate all derived expressions via Monte-Carlo simulations. Based on these expressions, the OP, ST, and EC of the proposed FD-HI-V2V system are investigated and compared with other related systems, such as ideal hardware (ID) and half-duplex (HD) systems, as well as a system over traditional Rayleigh fading channels (RFCs), to clearly show the impacts of negative factors.
키워드
Cascade Rayleigh fading, Ergodic capacity, Full-duplex vehicle-to-vehicle communication, Hardware im-pairment, Outage probability, System throughput
KSP 제안 키워드
Channel estimation(CE), Closed-form expressions, Electronic components, Ergodic capacity, Full-Duplex(FuDu), Half-Duplex(HD), Hardware Circuit, Hardware impairments, Monte-Carlo simulation(MCS), Non-ideal, Outage probability(OP)