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학술지 High Reliability Evaluation and Lifetime Prediction of 50 GHz Athermal AWG Module
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저자
윤광수, 유정희, 임권섭, 김영식, 전인수
발행일
202111
출처
Applied Sciences, v.11 no.23, pp.1-15
ISSN
2076-3417
출판사
MDPI
DOI
https://dx.doi.org/10.3390/app112311107
초록
A 96-channel (50 GHz-spacing) athermal AWG has been developed. It has a wide operating range due to reduced temperature dependence than conventional AWG. The temperature dependence of the center wavelength of the developed module satisfied the 짹0.05 nm range in all channels in the temperature range of ?닋40?뿦 C to 85?뿦 C, and the insertion loss variation was also less than 짹0.5 dB. As a result of validating its reliability through tests based on Telcordia-GR-1209 and GR-1221, the temperature dependence of the center wavelength satisfied the 짹0.022 nm range, and the insertion loss variation was also less than 짹0.2 dB. Accelerated life testing showed an expected service life of over 36.7 years, ensuring long-term safety of communication quality in harsh indoor and outdoor environments.
KSP 제안 키워드
22 nm, 5 nm, Accelerated life testing, Center wavelength, Communication quality, High Reliability, Indoor and outdoor environments, Lifetime Prediction, Reduced temperature, Reliability Evaluation, Service life
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