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Journal Article
High Reliability Evaluation and Lifetime Prediction of 50 GHz Athermal AWG Module
- Authors
- Kwang-Su Yun, Chong-Hee Yu, Kwon-Seob Lim, Young-Sic Kim, Insu Jeon
- Issue Date
- 2021-11
- Citation
- Applied Sciences, v.11, no.23, pp.1-15
- ISSN
- 2076-3417
- Publisher
- MDPI
- Language
- English
- Type
- Journal Article
- Abstract
- A 96-channel (50 GHz-spacing) athermal AWG has been developed. It has a wide operating range due to reduced temperature dependence than conventional AWG. The temperature dependence of the center wavelength of the developed module satisfied the 짹0.05 nm range in all channels in the temperature range of ?닋40?뿦 C to 85?뿦 C, and the insertion loss variation was also less than 짹0.5 dB. As a result of validating its reliability through tests based on Telcordia-GR-1209 and GR-1221, the temperature dependence of the center wavelength satisfied the 짹0.022 nm range, and the insertion loss variation was also less than 짹0.2 dB. Accelerated life testing showed an expected service life of over 36.7 years, ensuring long-term safety of communication quality in harsh indoor and outdoor environments.
- KSP Keywords
- 22 nm, 5 nm, Accelerated life testing, Center wavelength, Communication quality, High Reliability, Indoor and outdoor environments, Lifetime prediction, Reduced temperature, Service life, Temperature range
This work is distributed under the term of Creative Commons License (CCL)
(CC BY)
(CC BY)
