BROWSE
Detail
Conference Paper
Defect Analysis of Single Crystal Substrate for III-Nitrides using X-ray Topography
Cited - time in 
Share 
Share
- Authors
- S. B. Bae, H. S. Lee, H. W. Jung, S. B. Kim, J. H. Kim
- Issue Date
- 2021-11
- Citation
- 한국방사광이용자협회 방사광 이용자 연구 발표회 2021, pp.47-47
- Language
- Korean
- Type
- Conference Paper
- KSP Keywords
- III-nitride, Single crystal, X-ray topography, defect analysis