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Conference Paper A Study on the Interfacial Reliability of Micro-nano Bimodal Cu Sintered Joints on DBC/AMB Substrates for Power Module
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Authors
Kirak Son, Aesun Oh, Eunyoung Park, Hyun-Cheol Bae
Issue Date
2022-01
Citation
한국반도체 학술대회 (KCS) 2022, pp.369-369
Language
English
Type
Conference Paper
KSP Keywords
Interfacial reliability, Micro-nano, power module