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Conference Paper Mechanisms of Device Degradation Induced by Proton Irradiation in the GaN-based MIS-HEMTs
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Authors
Sung-Jae Chang, Hyun-Wook Jung, Il-Gyu Choi, Doyhyun Kim, Youn-Sub Noh, Sang-Heung Lee, Seong-Il Kim, Ho-Kyun Ahn, Jong-Won Lim, Dong-Seok Kim, Youngho Bae
Issue Date
2022-11
Citation
International Conference on Accelerators and Beam Utilizations (ICABU) 2022, pp.45-45
Language
English
Type
Conference Paper
KSP Keywords
GaN-Based, Proton Irradiation, device degradation
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