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Can surface plasmon resonance imaging accurately measure topographic height?
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- Authors
- Hyeon-Bong Pyo, Jeong Won Park, Hyung Ju Park
- Issue Date
- 2024-01
- Citation
- SPIE BiOS 2024 (SPIE 12860), pp.1-9
- Publisher
- SPIE
- Language
- English
- Type
- Conference Paper
- Abstract
- The study used a photon scanning tunneling microscope (PSTM) to obtain topographic and near-field images of dielectric surface features. Silica nanoprobes with an apex less than λ/10 were utilized. Light was directed through a prism to the metal-dielectric interface in total internal reflection (TIR) mode, with an adjustable incident angle and controlled polarization. Resonantly absorbed optical images of surface features were observed in the near-field, as well as interference patterns of surface plasmon waves at the plasmon resonance angle. Above the plasmon resonance, the optical images of surface features became inverted, indicating an off-resonance condition of the surface plasmons on the metal surface. The study found that the relative percent reflectivity (%ΔR) in the surface plasmon resonance imaging does not directly reflect the height of dielectric surface features, which mimic bio-materials on a sensor’s surface. There is always a distinctive region in which the height is proportional to the relative percent reflectivity
- KSP Keywords
- Near-field, Off-resonance, Optical image, Photon scanning tunneling microscope, Resonance angle, Surface plasmon(SP), Surface plasmon waves, bio-materials, incident angle, interference pattern, metal surface