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Journal Article Deep Learning Model for Cosmetic Gel Classification Based on a Short-Time Fourier Transform and Spectrogram
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Authors
Jae Ho Sim, Jengsu Yoo, Myung Lae Lee, Sang Heon Han, Seok Kil Han, Jeong Yu Lee, Sung Won Yi, Jin Nam, Dong Soo Kim, Yong Suk Yang
Issue Date
2024-05
Citation
ACS Applied Materials & Interfaces, v.16, no.20, pp.25825-25835
ISSN
1944-8244
Publisher
American Chemical Society
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.1021/acsami.4c03675
Abstract
Cosmetics and topical medications, such as gels, foams, creams, and lotions, are viscoelastic substances that are applied to the skin or mucous membranes. The human perception of these materials is complex and involves multiple sensory modalities. Traditional panel-based sensory evaluations have limitations due to individual differences in sensory receptors and factors such as age, race, and gender. Therefore, this study proposes a deep-learning-based method for systematically analyzing and effectively identifying the physical properties of cosmetic gels. Time-series friction signals generated by rubbing the gels were measured. These signals were preprocessed through short-time Fourier transform (STFT) and continuous wavelet transform (CWT), respectively, and the frequency factors that change over time were distinguished and analyzed. The deep learning model employed a ResNet-based convolution neural network (CNN) structure with optimization achieved through a learning rate scheduler. The optimized STFT-based 2D CNN model outperforms the CWT-based 2D and 1D CNN models. The optimized STFT-based 2D CNN model also demonstrated robustness and reliability through k-fold cross-validation. This study suggests the potential for an innovative approach to replace traditional expert panel evaluations and objectively assess the user experience of cosmetics.
KSP Keywords
CNN model, Convolution neural network(CNN), Cross validation(CV), Expert panel, Gel classification, Innovative approach, K-fold cross validation, Learning rate, Over time, Physical Properties, Robustness and reliability