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Conference Paper Analysis and Impact of Point Defects in Vertical GaN on GaN Diodes Grown by MOCVD
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Authors
문수영, 배성범, 김동한, 이현우, 김예진, 박승현, 이형석, 구상모
Issue Date
2024-06
Citation
한국전기전자재료학회 학술 대회 (하계) 2024, pp.1-1
Publisher
한국전기전자재료학회
Language
English
Type
Conference Paper
KSP Keywords
Vertical GaN, point defects