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Conference Paper Analysis and Impact of Point Defects in Vertical GaN on GaN Diodes Grown by MOCVD
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Authors
Soo-Young Moon, Donghan Kim, Sung-Beum Bae, Hyun-Woo Lee, Sang-Mo Koo, Hyung-seok Lee
Issue Date
2024-06
Citation
Compound Semiconductor Week (CSW) 2024, pp.1-1
Language
English
Type
Conference Paper
KSP Keywords
Vertical GaN, point defects
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