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Journal Article
Highly Enhanced Light Recycling in Quantum Dot Displays by Sidewall Reflectors
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- Authors
- Jaedong Jang, Hyunsu Cho, Sukyung Choi, Hyewon Jeon, Chan-mo Kang, Yongjae Kim, Hohyung Kang, Donghyo Hahm, Jin Sun Kim, Jong Ho Jeong, Jeong Ah Kim, Wonseok Choi, Soo-Yeon Cho, Woo-Bin Jung, Duk Young Jeon, Wan Ki Bae, Hyoc-Min Youn, Nam Sung Cho, Hee-Tae Jung
- Issue Date
- 2025-02
- Citation
- ADVANCED OPTICAL MATERIALS, v.13, no.5, pp.1-8
- ISSN
- 2195-1071
- Publisher
- WILEY-V C H VERLAG GMBH
- Language
- English
- Type
- Journal Article
- Abstract
- Quantum dot (QD) color conversion-based displays have emerged as one of the most promising next-generation devices due to their superior emission properties in terms of color expression. To date, however, existing QD color conversion layer (QD-CCL) technologies have suffered from low luminance and power efficiency, mainly due to significant light absorption by the bank structure. Here, the color conversion efficiency of QD-CCL has been significantly enhanced by fabricating a highly reflective metal layer on the side surface of the bank structure. Using a high-aspect-ratio silver reflector fabricated through a secondary sputtering lithographic technique involving argon ion bombardment, the fabricated QD-CCL is combined with a blue organic light-emitting diode (OLED) serving as a light source. As a result, light recycling from the reflector significantly enhances color conversion efficiency and luminance by up to 4.60-fold and 4.29-fold, respectively. Optical simulation reveals that higher pixel resolution provides greater reflection probabilities during extraction. This photomask-free approach is not only simple but also highly compatible with existing semiconductor fabrication processes, making it a viable commercial alternative for all color-converting structures that utilize light-emitting materials with omnidirectional emission characteristics.
- KSP Keywords
- Argon ion, Bank structure, Blue organic light emitting diodes, Conversion efficiency(C.E.), Emission properties, Fabrication process, High Aspect Ratio, Light absorption, Light source, Light-emitting materials, Lithographic technique