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Conference Paper
Microscopic Approach to Evaluating Technological Convergence Using Patent Citation Analysis
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- Authors
- Ki Hoon Sung, Tae Han Kim, Hee-Kyung Kong
- Issue Date
- 2010-12
- Citation
- International Conference on U- and E-Service, Science and Technology (UNESST) 2010 (CCIS 124), v.124, pp.188-194
- Publisher
- Springer
- Language
- English
- Type
- Conference Paper
- Abstract
- Technological convergence has been an important source of technological innovation in industries. We take a microscopic approach to the question for measuring and evaluating the level of technological convergence using patent citation analysis. We develop a convergence indicator that shows the relative convergence degree of a patent. This indicator is based on the backward and forward patent citations that could assess the extent of the level of convergence or originality. In this paper, we test the method that could evaluate the relative level of convergence in individual patents. © 2010 Springer-Verlag.
- KSP Keywords
- Convergence indicator, Microscopic approach, Patent citation analysis, Technological convergence, technological innovation