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Conference Paper Non-Destructive PCB Sub-mm Inspection Using Atomic Magnetometry

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Authors: JungHoon Oh, Hyun Joon Lee, Kyeseok Yoon, In-Kui Cho

Issue Date: 2025-11

Citation: Conference on Antenna Measurements and Applications (CAMA) 2025, pp.1-3

Language: English

Type: Conference Paper

KSP Keywords: Atomic magnetometry, non-destructive

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